Used HITACHI S-4500 #293765057 for sale

HITACHI S-4500 Scanning Electron Microscope is an advanced tool for imaging and analyzing various samples at a sub-micron scale. It utilizes three modes of operation: the secondary electron (SE) imaging mode, the backscattered electron (BSE) imaging mode, and the low-voltage imaging (LVI) mode. In the SE imaging mode, a beam of high-energy electrons is finely converged and deployed on a sample surface. When the electrons collide with the sample surface, secondary electrons are emitted and collected by the secondary electron detector. This allows for a high-resolution imaging of the sample topography. In the BSE imaging mode, a beam of electrons does not interact directly with the sample surface but rather with the material composition of the sample. BSE imaging is useful for obtaining sample material information, such as its elemental composition and density. It is best used in conjunction with SE imaging. In the LVI mode, imaging is conducted using an electron beam of a low voltage, thereby allowing sample images with larger field of view than SE or BSE. In this mode, SE and BSE images can be acquired simultaneously. HITACHI S 4500 has a wide range of applications. Its SE and BSE modes are suitable for examining semiconductor and nanostructures, while its LVI mode is well-suited for examining materials, such as ceramics, polymers and biological samples. S-4500 comes with a variety of accessories that are optimized for these applications. Additional features enhance the experience of operating S 4500. Its low drift operation and enhanced vacuum system support a stable imaging environment for long, uninterrupted observations. Automated image stitching allows for larger field of view images to be acquired, and electron beam and detection parameters are optimized for each application. HITACHI S-4500 Scanning Electron Microscope is a versatile microscope for any lab environment. It provides precision imaging and analysis, combined with robust features and efficient operation.