Used HITACHI S-4500 #293799821 for sale

HITACHI S-4500
ID: 293799821
Scanning Electron Microscope (SEM).
HITACHI S-4500 is a scanning electron microscope (SEM) that offers versatile and cost-effective imaging capabilities for a broad range of applications. HITACHI S 4500 SEM includes a range of advanced features, such as a high resolution variable pressure detector with real time display of chamber conditions, as well as a comprehensive range of automated operations. S-4500 has an impressive range of technologies, such as a TrueVIS enhanced field emission gun, a high-resolution critical orifice pressure detector, a magnetically levitated tilt stage, and an automated halo contrast imaging system. The TrueVIS gun is an important part of S 4500's imaging platform, providing excellent gun stability and offering a wide range of capabilities. Seamless switching between high and low magnification, combined with acceleration parameters from 0.1V to 10kV and a high-accuracy deflection system for accurate stage and image alignment, ensure maximum performance. Additionally, the TrueVIS gun and the high-resolution detector allow for maximum image resolution and excellent control of the chamber and imaging conditions. HITACHI S-4500 is also equipped with a high-quality, high-resolution column designed to ensure reliable and accurate imaging conditions. The SEM features an automated, 4+1-axis robotically operated sample stage that allows for alignment of specimens while also enabling unrestricted maneuvering. Advanced automated sample navigation with joystick commands and an ultra-high nanocenter also allow for easy scanning and easy alignment of different specimen areas. In addition, the FEG emission gun of HITACHI S 4500 SEM is equipped with a 3-point stem vacuum drive and a high-precision deflection lens that support reliable and highly accurate imaging. S-4500 SEM also offers a range of automated and manual options for sample preparation. Automatic thickness setting, automatic edge detection, and laser based focus and gain adjustment features provide increased productivity and ease of use. The automated sample exchange function supports quick specimen changing, while a built-in auto clean feature ensures the highest levels of imaging quality. S 4500 is also equipped with an automated automated post-imaging data management and analysis system to help streamline workflow. HITACHI S-4500 is a highly advanced scanning electron microscope that delivers excellent image quality and superb flexibility. Its advanced technologies and automated operation features provide a comprehensive array of options that make it an ideal choice for a wide range of applications. With its comprehensive range of features and capabilities, HITACHI S 4500 offers excellent performance, reliability and affordability.
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