Used HITACHI S-4500 #9137332 for sale

HITACHI S-4500
ID: 9137332
Scanning Electron Microscope (SEM).
HITACHI S-4500 is a high performance scanning electron microscope (SEM) that is ideal for a wide variety of applications across industry research, quality control and failure analysis. It combines high resolution imaging, easy to use operation and excellent sample preparation capabilities, making it an ideal choice for a variety of applications. HITACHI S 4500 uses a range of electron beam sources, including a tungsten gun, a heated cold field emission gun, a filsup gun and a micro-field emission gun, to provide a range of imaging options, including a dual-beam imaging mode. This dual-beam imaging mode allows images to be captured at high resolution without the need for multiple electron beam sources, making it extremely efficient and cost effective. The SEM also offers a range of magnifications, ranging from 10x to 500,000x, allowing detailed studies of crystalline structures, surfaces and materials properties. S-4500 also features a number of features to facilitate sample examination. A touch panel control equipment allows for easy operation, while an automated sample exchange system allows for the swift switching between samples. Automated surface coating, electron beam coating and ion beam coating systems are also included, allowing for a variety of samples to be coated for the SEM analysis. Additionally, S 4500 includes a wide range of detector and imaging aids, including an advanced auto-correlation detection unit, time-of-flight secondary ion mass spectrometry (TOF-SIMS) and a cryo-stage, allowing for more in-depth analysis of samples. HITACHI S-4500 is equipped with a number of advanced software packages, providing automated analysis and measurements of samples. These include a 3D measurement machine, a neutron mapping tool and an X-ray imaging asset, allowing for quick and accurate detection and measurement of features in a sample. Additionally, the SEM is equipped with a series of ancillary systems for optimizing the imaging and analytical performance of the model. These include a built-in high-performance vibration isolation equipment, an HDTV camera and an EDS detector, allowing for a streamlined workflow. In conclusion, HITACHI S 4500 is a highly versatile and capable SEM, suitable for a range of research and industrial applications. Its range of electron beam sources, imaging and measurement systems, and automated sample preparation and exchange capabilities make it an ideal choice for a variety of scanning electron microscopy needs.
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