Used HITACHI S-4500 #9144746 for sale
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ID: 9144746
Vintage: 1996
Scanning electron microscope (SEM)
YAG BSE Detector
Operational
1996 vintage.
HITACHI S-4500 scanning electron microscope (SEM) is an advanced instrument used to image, measure and analyze a wide range of materials and biological samples, from microorganisms to large industrial components. Despite its compact design, it offers high resolution imaging and an impressive range of capabilities. HITACHI S 4500 is equipped with a large image sensor and a powerful electron detector, allowing it to capture images with a resolution of up to 5 nanometers. It can magnify samples up to 15,000 times their original size, enabling detailed analysis of even the smallest components. S-4500 also allows users to measure dimensions, analyze sample composition and even perform sputter coating to improve imaging quality. S 4500 offers a range of specimen preparation capabilities. It can be used for freeze drying, dehydration, critical point drying and heat treatment, to name a few. Other preparation methods (such as ion milling, electrodeposition, laser ablation and thermal cleaning) can also be performed using compatible accessories. HITACHI S-4500 includes a wide range of other features to enhance performance, such as an auto-focus system, integrated software and automated functions, and an image processing package. In addition, it can be connected to an automated preparation station, allowing users to quickly and safely move samples between stages. For convenience, HITACHI S 4500 is equipped with an intuitive user interface and built-in tutorials. It also has a remote control mode, allowing users to access the unit from any computer with a web browser. This can be used for remote operation, monitoring, and even for data transfer and storage. S-4500 is a highly advanced scanning electron microscope, offering a range of powerful capabilities and reliable performance. Thanks to its user-friendly interface, comprehensive features, and flexible accessories, it can greatly improve the analysis of specimens in a wide range of fields.
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