Used HITACHI S-4500 #9183139 for sale
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ID: 9183139
Scanning electron microscope (SEM)
EDX Scanning electron system (Type II)
Cold emission FEG
0.5KV - 30KV
1.5mm @ 15KV
4.0nm @ 1KV
6" Load lock
(5) Axes manual stages
Stage XY range: 100mm x 50mm
25mm Z
Tilt: -5° to +60°
Includes:
Diffusion pump
Mechanical pumps
Chiller
Compressor
Transformer.
HITACHI S-4500 Scanning Electron Microscope (SEM) utilizes electron optics and digital imaging technology to conduct non-destructive examinations of surfaces and bulk samples with high accuracy and resolution. The instrument is capable of accommodating a wide range of samples sizes ranging from 1mm to 300mm in height, featuring humidity and gas-proof systems. HITACHI S 4500 utilizes an electron gun to generate a beam of electrons that impinge on the sample surface. The interaction between the sample surface and the impinging electron beam generates secondary electrons, backscattered electrons, and X-rays, which in turn are detected and amplified. The detected signals are then processed to generate an image of the sample's surface and its composition. S-4500 features modernized imaging technology, including multi-image generation, auto alignment, and image fusion, that enable fast image acquisition with higher resolution and greater precision than conventional SEMs. This technology also allows for the use of 3D imaging and mapping. In addition to its imaging capabilities, S 4500 also delivers accurate elemental analysis of samples. The instrument measures the sample's atomic number, atomic percentage, and element concentration. It can also detect the presence of non-conductive materials by utilizing a non-conductive field emission scanning electron gun (FESEM). Finally, HITACHI S-4500 is equipped with a wide variety of imaging and analytical tools, including X-ray microanalysis, electron field emission surface analysis, and electron beam induced current imaging, that can be used to assist in inspections and quality assurance processes. The instrument also contains a host of safety measures such as an automated interlock system and a laser warning system. HITACHI S 4500 Scanning Electron Microscope is a reliable, user-friendly, and versatile instrument that can be used for a variety of applications from microscopic studies to industrial inspections. Its combination of imaging and analytical capabilities makes S-4500 a valuable tool for examination, quality assurance, and research.
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