Used HITACHI S-4500 #9202782 for sale

HITACHI S-4500 Scanning Electron Microscope (SEM) is a widely used and highly versatile instrument designed for the imaging and analysis of materials at the nano-scale. The device utilizes a high energy, focused electron beam to detect areas of interest in the sample and generate an image. HITACHI S 4500 is capable of scanning or imaging samples with a resolution down to 1 nanometer (nm) and includes an adjustable magnification feature ranging between 5X and 800,000X. The SEM utilizes a high voltage electron gun to generate a concentrated beam of electrons that can be adjusted in size and intensity to provide a high-resolution image. S-4500 is equipped with a newly developed ZEEnith low-noise electron optics, which significantly reduces image noise and provides clear images of samples even at high magnifications. Additionally, the instrument is equipped with a multi-channel electron detector that provides high signal-to-noise ratio and high image contrast. The device also includes an array of built-in sample stages for heating, cooling and vibration and can be used for a variety of application requirements. In addition to traditional topographic imaging S 4500 SEM offers many advanced imaging modes for specialized applications. Backscattered electron imaging is useful for characterize the mechanical, electronic, and topographical properties of materials at a resolution of up to 50 nm. Energy Dispersive X-ray Spectroscopy (EDS) is also included and is useful for elemental analysis of samples with a resolution down to 1 nm. HITACHI S-4500 is designed to permit a high degree of automation to ensure accurate, efficient and optimized sample analysis. Several software options are available for automated operation such as FeatureFinder, which can help identify different textural regions, and Automap Autostage, which simplifies pattern recognition. In summary, HITACHI S 4500 Scanning Electron Microscope is a powerful and sophisticated tool capable of generating high-resolution images and performing advanced analysis of materials at a nano-scale. Its excellent imaging capabilities and its variety of advanced operation modes make it the perfect choice for a wide range of scanning electron microscopy applications.