Used HITACHI S-4500 #9208237 for sale

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HITACHI S-4500
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ID: 9208237
Scanning Electron Microscope (SEM).
HITACHI S-4500 is a well-respected and sophisticated scanning electron microscope. It features a high acceleration voltage of 160kV, and provides excellent imaging resolution of down to 0.4 nm for extremely detailed images. HITACHI S 4500 also has a unique specimen chamber design, which includes a three-condenser configuration and a wide-angle viewing system for ease of observation. The specimen chamber can be adjusted for a range of specimen sizes and shapes which helps to ensure optimal viewing. S-4500 is equipped with a retractable secondary electron detector, allowing for observation of ultra-thin and fragile specimens. Additionally, it offers a top-of-the-line digital imaging system with a resolution of 8 megapixels. This improves the overall imaging performance of the electron microscope and enables higher levels of image detail. S 4500 also features HITACHI advanced HyperEarth Microscope (HEM) technology. This technology utilizes an electron optical column to create an electrostatic field, improving the "depth-of-field," the contrast and clarity of the images, while simultaneously reducing charging effects. In addition, HITACHI S-4500 has a wide range of advanced applications, such as Whole Cell Imaging, High-Resolution Imaging, Automatic Defocused Imaging, and Automated Sub-Nanometer Imaging. The microscope also includes an integrated EDS (Energy Dispersive Spectrometer) with a resolution of 10μm, allowing users to perform point and line scans for detailed analysis of elemental composition. Finally, HITACHI S 4500 features an easy-to-use graphical user interface, integrated sample preparation tools, and a suite of specialized programs, allowing for a wide range of advanced analytical and imaging applications. Overall, S-4500 Scanning Electron Microscope is an exceptional tool for imaging and analyzing samples at the nano-scale. Its combination of high resolution and advanced applications makes it a great solution for demanding imaging and analysis tasks.
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