Used HITACHI S-4500 #9227445 for sale
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HITACHI S-4500 is a scanning electron microscope (SEM) that offers an advanced imaging and analysis solution. The microscope offers superior imaging capability and is designed for efficient and reliable operation in a variety of research and industry applications such as failure analysis, material characterization, nanochemistry and medical research. HITACHI S 4500 utilizes a combination of upper polepiece and binary electron lenses to provide both a broad range of magnification and field-of-view options. This equipment allows for magnifications from 10x to 500,000x, and offers both high-resolution, topographic imaging and low-voltage scanning of specimens. S-4500 utilizes a three-stage condenser lens system, which enables its user to select the most suitable operating conditions for dealing with various kinds of samples. S 4500 also has a built-in, computer-controlled manipulation unit. This machine expands the range of operations, allowing the user to make precise sample orientation movements with minimal effort. The tool also enables a range of automatic functions to be performed, saving time and effort. HITACHI S-4500 offers a range of automated features tailored to make specimen preparation easier. These features include a fully motorized sample holder for precise sample positioning, a special calibrator mode for precisealignment confirmation, precise out-of-axis sample alignment, and automated grid preparation. HITACHI S 4500 is supplemented by a range of accessories that provide further enhanced capabilities. These include a tunable beam decelerator, a field-emission gun, and a fast field-emission gun with an adjustable size aperture. These features allow sophisticated analysis of even the most complex samples. Finally, S-4500 also features a user-friendly and intuitive interface. This interface provides easy access to all functions and features of the microscope and allows the user to adjust the various operational settings quickly and easily. This ensures that even the most complex analysis tasks can be carried out with minimal effort.
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