Used HITACHI S-4500 #9230713 for sale

HITACHI S-4500
ID: 9230713
Scanning Electron Microscope (SEM).
HITACHI S-4500 is a scanning electron microscope (SEM) that offers strong performance and superior imaging quality. This microscope has an advanced imaging capability that enables it to produce images with excellent detail and clarity. The high vacuum environment created within the microscope chamber allows for in-depth analysis and imaging of samples, which provides a better understanding of their structure. The powerful imaging system is composed of an electron gun that produces a fine-scaled beam that passes through the sample and is detected by the electron detector. The beam is then converted into a signal that is used to construct a digital image. The images produced by HITACHI S 4500 can be highly magnified and more detailed than those produced by other traditional methods of microscopy, allowing for non-destructive nanoscale imaging of materials. S-4500's scanning drive enables users to collect information from a sample quickly, allowing for faster analysis and imaging of samples. The drive is equipped with an automated function that can automatically detect small changes in the sample's surface and cleverly guide the electron beam to produce a more detailed image. S 4500 is designed to be user-friendly and is equipped with features that make operating it easy. For instance, the automatic vacuum coat feature allows for quick and accurate deposition without the need for manual degassing, enabling higher analysis throughput. HITACHI S-4500 is also equipped with several advanced features that enable users to go beyond traditional SEM capabilities. For example, the high-speed backscatter electron detector detects ions generated from the sample surface, enabling high-quality elemental analysis. This system is also equipped with an energy dispersive X-Ray detector that enables users to identify and analyze different kinds of materials in the sample. Overall, HITACHI S 4500 provides an advanced, high-performance SEM system that is easy to operate and enables superior imaging and analysis capabilities. By utilizing its powerful imaging and analytical systems, users can gain invaluable insights into their materials and samples, enabling more accurate and thorough analysis.
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