Used HITACHI S-4500 #9235002 for sale

HITACHI S-4500 scanning electron microscope is a versatile tool for imaging and characterization of a wide range of samples and materials. This SEM is an excellent choice for routine imaging, failure analysis tasks, and more. HITACHI S 4500 has a high resolution scanning electron detector as well as a backscattering detector. The combination of these two detectors allows for high-resolution imaging and material analysis of a variety of samples. S-4500 also has two high magnification lenses (up to 100kX) giving it extremely high resolution images. Additionally, the twin lens system provides simultaneous imaging and spectral analysis. The instrument utilizes a field emission gun (FEG), a type of electron source that minimizes the artifacts created by an electron beam, enabling high resolution imaging and fine detail. It features a robust, force feedback beam deflector, enabling the instrument to maneuver smoothly over large sample areas. The deflection system also enables S 4500 to perform many different imaging techniques. HITACHI S-4500 has a wide range of independent detector heads, allowing for the addition of additional detectors to increase sensitivity, contrast, and resolution. It also features automated stage functions and visual specimen navigation. HITACHI S 4500 can be integrated with a variety of accessories, including a cryo-holder for imaging at low temperatures, and a sample rotator to enable 3D imaging. S-4500 is highly cost-effective, with excellent image quality and a fast imaging speed. It is a reliable, easy-to-use instrument, which can be used for both routine imaging and failure analysis tasks. It also provides excellent support for both 3D imaging and elemental analysis, enabling the user to gain a deeper insight into the sample material.