Used HITACHI S-4500 #9300398 for sale

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ID: 9300398
Scanning Electron Microscope (SEM) Digital conversion kit With backscatter Chamberscope.
HITACHI S-4500 is an advanced scanning electron microscope (SEM) with high magnification capabilities, high resolution imaging and an efficient suite of analytical instrumentation. This equipment is equipped with a comprehensive range of features, making it a versatile tool for both R&D applications and industrial production processes. The core optical system uses an in-lens electrostatic objective to produce high resolution images in both secondary electron (SE) and back-scattered electron (BSE) modes with a magnification range of 500x to 500,000x. In addition, it can be used in combination with an optional cryo-prep device for cryogenic sample preparation. The inclusion of a dual SEM column setup ensures that various types of electron beams can be used for imaging, such as incoherent back-scatter, multiple direction energy dispersive analysis and coupled energy analysis. The unit is well-suited for many applications. It has a beam overlay function for dual SEM imaging, allowing the simultaneous recording of two images for comparison purposes. This machine also contains an automated control tool for various sample preparations, such as auto-focus, stigmation and auto-graphic scans. In addition, the asset has multiple analytical capabilities, such as energy dispersive spectroscopy (EDS), electron back-scatter diffraction (EBSD) and cathodoluminescence (CL) imaging. The model also includes other features such as a large field-of-view CCD camera with auto-focus capability, an integrated wafer stage device, a mini-stage with X/Y and Z axes, and a rear part-receiving station. The equipment is thus able to deliver accurate results in a variety of materials. Thanks to its dual SEM column design and multiple analytical capabilities, HITACHI S 4500 is an ideal tool for R&D and production operations. With its advanced hardware and software, as well as its high resolution imaging capabilities, this system provides an excellent tool for material analysis, microscopy and materials science. This unit is also advantageous for its automated control machine and robust precision.
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