Used HITACHI S-4500 #9388050 for sale
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HITACHI S-4500 scanning electron microscope (SEM) is a high-performance tool that provides high-resolution imaging and analytical capabilities across a wide range of applications. The instrument has a high vacuum equipment consisting of an ion getter pump and a turbo molecular pump for a complete vacuum filtration system. The optical column of HITACHI S 4500 features a field emission gun with Gaussian optics, a large stage rotation turntable and a high power x-ray detector. The stage is adjustable and allows rapid sample to detector distances as well as sample observation at various angles. The unit also allows for high voltage precision control with a resolution of 0.1V. In conjunction with its imaging capabilities, S-4500 also has an analytical machine featuring a Rotating Anode X-Ray Generator with an x-ray diffraction detector. The analytical tool provides great accuracy for the elemental analysis of the sample. The instrument can be used for a variety of applications including failure analysis and 3D imaging. To further enhance the analytical capabilities of S 4500, the asset can be equipped with a variety of detectors including an Energy Dispersive spectrometer (EDS), an electron backscatter diffraction (EBSD) detector, an extended low voltage imaging model, and a Scanning Auger Microscope (SAM) for nanoscale measurements. HITACHI S-4500 also has advanced user control settings which allow the user to adjust a wide range of variables, such as stage speed, electron beam current and voltage, brightness, and digital image size and shape. Furthermore, the instrument is controlled through a touch-screen monitor, enabling intuitive and easy control. When it comes to performance, HITACHI S 4500 is a reliable and powerful instrument. With its high resolution imaging capabilities and a wide range of analytical functions, S-4500 can be used for a variety of applications. From failure analysis, to 3D imaging, to elemental analysis - S 4500 is an ideal choice for any scanning electron microscopy requirements.
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