Used HITACHI S-4500 #9389222 for sale

HITACHI S-4500 is a scanning electron microscope (SEM) that offers excellent image resolution with linear scanning capabilities. This versatile device has a range of magnification capabilities ranging from 10x to 200,000x, allowing users to easily observe a wide selection of samples. HITACHI S 4500 is equipped with a four-quadrant digital photomultiplier detector, allowing users to capture images in a variety of modes. This detector allows the microscope to be used not only for high resolution imaging, but also for atomic force microscopy. S-4500 is well-suited for rapid automated imaging of near-surface and subsurface sample structure. Its applications are further extended by the ability to perform sample orientation scans where samples of different height profiles can be investigated. S 4500 uses an automated electron gun alignment system to ensure optimum beam alignment and sample placement, allowing for discernment of even the finest details of a sample. HITACHI S-4500 features an environmental chamber for operation in an oxygen-free atmosphere. This offers the user some protection from oxidation of the sample, an especially useful feature when observing high-resolution images from easily oxidized materials such as carbon or aluminum. HITACHI S 4500 also offers a low vacuum mode, ideal for detecting changes in the sample structure quickly. In addition to its high resolution imaging capabilities, S-4500 also offers secondary and backscatter electron imaging capabilities. This is done through the incorporation of additional detectors and preamplifiers, to capture an array of different electron signals. S 4500 also features an integrated circuit card reader, allowing for rapid digital memory card access. This allows the user to save images and videos taken during an imaging session. The combination of HITACHI S-4500's fast automated system, wide range of imaging modes and capabilities, and ease of use make it a desirable scanning electron microscope device. Its precise imaging capabilities and extraordinary performance have made it popular amongst semiconductor engineers and researchers. The controls are also easily adjustable, providing the user with a comfortable setting to make changes and adjustments to the microscope. This allows for effective analysis and imaging of sample materials.