Used HITACHI S-4500 #95678 for sale
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ID: 95678
Wafer Size: 2"
Vintage: 1994
Scanning Electron Microscope (SEM), 2”
Performance:
Secondary electron image resolution: 1.5 nm at 15kv
Magnification: 20X - 500KX
Electron Optics:
Electron gun: Cold field emmission source
Lens type: electromagnetic
Objective aperture: 4 position externally selectable
Stigmator: Octopole electromagnetic
Scanning coil: 2-stage electromagnetic
Size: Type I
Airlock: prepumped, max sample size:50 mm diameter
Stage motion: 5 axis manual
X/Y: 25 mm, Z: 3-28 mm, T: -5Deg - +45 Deg., R: 360 deg continuous
Draw-out door: Max sample size:150 mm dia.
Display system:
Image display: Dual 12" monitors
Scanning mode: Normal, reduced area , line scan, photo scan, spot position, split screen
Scanning speed: TV, 0.3, 2, 9, 25, 35, 100, 160 320 s/frame
Signal processing:Real-time processing, auto-brightness and contrast control, dynamic stigmator, sutofocus, a Frame averaging, frame integration, contrast conversion,
Vacuum system:
Full automatic operation with pneumatic valve control
Ultimate vacuum: 10 (-7) Pa in electron gun chamber, 10(-4) Pa in specimen chamber
Ion pump: 60 L/s X1, 20 L/s X2
Speciment chamber: DP (570 L/s); Turbo Optional
Foreline: Rotary pump X2
Accessories (Optional)
EDX:at 30 Deg. take off angle
Digital Image capturing: Orion-6 software, Optional
Chilled water circulator: 10 - 20 deg C, 1.0 -1.5 L/m for DP only
Installation
AC: Single phase AC 220 or 240 volt, 50/60 Hz
Grounding: Independent grounding 100 Ohms or less
Currently powered-up
1994 vintage.
HITACHI S-4500 is a scanning electron microscope (SEM) designed for advanced materials analysis. This instrument is equipped with advanced technology, including a cold field emission gun, high tension power supplies, and digital imaging equipment. HITACHI S 4500 offers high resolution for observation and imaging of samples using secondary or backscattered electrons. The cold field emission gun provides extremely stable performance and allows for faster operation. It also allows for high-resolution magnification of samples up to 30 milling times. This microscope has a high background rejection rate and low irradiation levels, which reduces sample damage. The high tension power supplies provide an enhanced user experience and stability in the most demanding SEM applications. The tension power supplies can be coordinated with the cold field emission gun to deliver the highest performance. The digital imaging system enables users to capture the magnified sample image onto a digital video recorder or personal computer by connecting with an image capture card. Images are displayed on a 19-inch TFT monitor, offering improved visibility and convenience. The digital imaging unit also allows for real-time image management, manipulation and storage for later use. S-4500 scans samples at multiple angles to enhance contrast and texture in the sample image. Additionally, it is equipped with advanced automation tools, including auto focus to achieve optimal imaging results at any magnification. The computer-assisted tuning feature can automatically detect and adjust parameters for the brightest and clearest image of the sample. For maximum safety, S 4500 is built with an enclosed machine and is provided with ESD protection. It also has a number of safety features, including a radiation indicator and an automatic shut down features in the case of any hazards.
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