Used HITACHI S-4700 II #293592008 for sale

HITACHI S-4700 II is a top-of-the-line scanning electron microscope that offers powerful imaging capabilities for a wide range of applications. It offers a high degree of accuracy and resolution, allowing for detailed visualization of objects at the nanoscale level. HITACHI S 4700 II utilizes a top-mounted differential in-lens detector which allows for high-quality collection of secondary electrons (SE), backscatter electrons (BSE), and transmission electrons (TE) of the surfaces of the sample. It has a double-tilt specimen stage with a tilt range of +/- 60 degrees, allowing for flexibility when imaging samples that are not planar. It also offers a motorized focus drive, allowing users to automatically adjust the focus of the images without direct user interaction. S-4700-II offers a number of image processing features, such as real-time image stitching, montages, automated particle analysis, and more. It also offers a wide range of automation capabilities, including remote access, automated acquisition of multiple images, and the ability to interconnect S 4700-II units for remote operations. S 4700 II utilizes an open-source workflow application, AllView, which allows users to easily manage, analyze, and archive large datasets. AllView enables users to interact with images, generate reports, and share data among users, providing for a detailed understanding of the sample and specimen. When coupled with its advanced scanning, imaging and processing capabilities, HITACHI S 4700-II is an invaluable tool for research in the fields of nanotechnology, materials science, and biotechnology, with capabilities to image samples ranging from single cells to complex structures and materials. HITACHI S-4700-II provides researchers an incredibly powerful and user-friendly tool to image and analyze samples at the highest level of accuracy and resolution.