Used HITACHI S-4700 II #9177296 for sale

HITACHI S-4700 II scanning electron microscope is a high-performance instrument capable of producing detailed images of samples for research and industrial applications. It is designed to deliver high resolution imaging while featuring flexible and user-friendly operation. The equipment offers several advanced imaging options, including secondary electron imaging, backscattered electron imaging, and in-lens secondary electron imaging. It uses a highly sensitive, direct detection camera to support high resolution imaging down to 0.7 nm. Additionally, the system includes an integrated energy filtering unit with a range of 30 to 200 eV. The machine also features an advanced stage control tool with a three-axis sample stage with a 3-mm range of motion and a tilt range of ±5°. It offers a specimen rotation option for dual imaging, and a stop and go option for intermittent sample rotation. HITACHI S 4700 II offers a number of options to facilitate sample preparation, including the dual beam Low Vacuum Auto-Preparation Asset (LVA), a high-precision ion milling model, and an electron beam lithography equipment. It also has an advanced cooling capability to reduce thermal drift and energy leakage from the electron source. Finally, the system features an ultra-compact design and ergonomic operation panel for easy operation. S-4700-II supports a network connection via LAN and enables remote operation. It also offers a built-in image analysis finish processor for fast optimization of image quality. Overall, S-4700 II scanning electron microscope offers a number of features and options designed to produce high-resolution images with ease and flexibility. With its advanced imaging capabilities and multiple features, S 4700 II is an ideal tool for research and industrial applications.