Used HITACHI S-4700 II #9389830 for sale

HITACHI S-4700 II scanning electron microscope (SEM) is an advanced imaging equipment that is used in research and development, quality assurance and failure analysis applications in a wide range of industries. It offers high resolution imaging at magnifications of up to 30,000 times with an operational magnification of 1.3 to 500,000 times. The system is equipped with a cold field emission gun (FEG) and has a choice of two electron optics systems, a light unit and a high performance machine. HITACHI S 4700 II has a unique Dual Detector Feature, which enables simultaneous operation of two detectors. This feature offers improved measurement accuracy, faster analysis and less processing time. The analytical detector detector tool includes a backscattered electron detector for compositional analysis and a secondary electron detector for three dimensional surface imaging. The light detector asset, on the other hand, is composed of light detector for high speed imaging and a bright field detector for color mapping of biological specimens. S-4700-II is also equipped with an energy dispersive X-ray spectrometer (EDS) with four-element detector and an automatic alignment model. This adds to the efficiency of operation, making time consuming manual alignment unnecessary. The EDS allows for elemental mapping analysis, detection and identification of elements down to atomic level. With these efficient features, HITACHI S-4700-II offers the best possible balance of high resolution imaging combined with high speed data processing. The automated gun optics equipment of S 4700-II features automatic tracking and fine focus control for precise beam adjustment. Additionally, the system is capable of pulse mode imaging and drift supplied compensation (DSC) to reduce thermal drift that is common to collect data with high precision. S-4700 II has an intuitive graphical user interface (GUI) and an automatic macro function as well that improves operational efficiency. The GUI allows for effortless navigation of the software and the acquisition of highly detailed images from large specimen areas such as circuit boards or biological cells. S 4700 II is the ideal scanning electron microscope for researchers and engineers that need high resolution imaging combined with efficient automation and user friendly operation. With its precision, speed and analytical capabilities, HITACHI S 4700-II provides the best scanning electron microscopy experience with its combination of advanced features.