Used HITACHI S-4700 II #9395237 for sale

HITACHI S-4700 II is a scanning electron microscope (SEM) with superior performance and advanced features. It has been designed to meet the demands of professional-level scanning electron microscopy and materials analysis. HITACHI S 4700 II combines high resolution imaging and analytical capabilities with a broad range of sample preparation techniques. S-4700-II has dual gun design, offering improved resolution and greater contrast. It is equipped with an electron gun with an emission current up to 10 nA and a gun voltage up to 10 kV. It has an accelerating voltage that can be adjusted in 1 V steps over a range of 1-30 kV. The accelerating voltage can be further fine-tuned in 1 V increments between 1-10 kV. The acceleration voltage used by this microscope can affect the quality of the images and the analysis results. S 4700-II offers a choice of detectors including a digital signal processor (DSP) detector, back-scattered electron (BSE) detector, and low voltage secondary electron (LVSEM) detectors. It can also be equipped with an energy-dispersive X-ray spectrometer (EDS) for elemental analysis. HITACHI S-4700-II has an automated sample changing mechanism with up to six specimen holders. When making multiple specimen holders it can save a lot of time. S 4700 II has a variety of imaging modes including bright-field, secondary electron, backscattered electron, cathodoluminescence and mass spectroscopy imaging. S-4700 II can be used for both field emission and variable pressure scanning. It is capable of performing a variety of sample preparation techniques including ion milling, chemical etching, coating and sputter etching. The SEM also has a computer aided automation (CAE) feature "SEI-Monitor" which makes operation easier. This feature ensures the highest image quality by automatically setting optimum imaging conditions. HITACHI S 4700-II also offers a series of software communication programs which allow the analyst to analyze images quickly. HITACHI S-4700 II offers numerous advantages including improved resolution, broad range of sample preparation techniques, automated sample changing mechanism, and improved contrast. It is a reliable tool for professional analysis and imaging, and its advanced features makes it useful for myriad applications.