Used HITACHI S-4700 Type I #293597105 for sale

HITACHI S-4700 Type I scanning electron microscope (SEM) provides high-resolution microscopy imagery and composited element analysis. It features a detailed image resolution of up to 10 nm, with a field of view of up to 90mm in diameter. The microscope boasts advanced features such as a liquid nitrogen-cooled electron gun, large chamber capacity and high ion-beam current of up 45mA. S-4700 Type I offers a range of imaging techniques including TEC (thermal electron capture), backscatter electron imaging (BSE), optical diffraction, SE (secondary electron imaging) and EBIC (electron beam induced current). It is also equipped with e-beam lithography, which enables the generation of precise 3D structures. The equipment is configured with a special digital imaging system, the ADC (analog-to-digital control) that helps in the acquisition of digital images that are of higher fidelity than those obtained from analog methods. HITACHI S-4700 Type I is also highly versatile, allowing for the direct manipulation of samples with the same precision and accuracy as traditional SEMs. Additionally, the unit is fitted with an STM (scanning tunneling microscope) as well as an EDX (energy dispersive X-ray) detector for chemical analysis of various elements and phases. Additionally, the microscope can be integrated with computers to ensure remote control and automation. Integrated with cutting edge features and precise control, S-4700 Type I makes it an invaluable choice for a wide range of industrial and academic applications. With superior performance, reliability and scalability, the machine will be a valuable addition and enables researchers and scientists to explore the microstructural parameters of advanced materials and components.