Used HITACHI S-4700 Type I #293604809 for sale

ID: 293604809
Scanning Electron Microscope (SEM) 5-Axis manual.
HITACHI S-4700 Type I Scanning Electron Microscope (SEM) is an imaging device that uses focused electron beams to magnify and analyze the structure of samples. It has a high resolution and offers a wide range of possibilities for both visual inspection and microscopic analysis. The S-4700 utilizes an electron gun to generate a tightly focused beam of electrons, controlled via a magnetic lens system. The electron gun is a vacuum chamber containing an anti-cathode that produces electrons. This electron beam is then mobilized across the sample in a scanning pattern and the interactions between electrons and sample surface atoms produce secondary signals, which are picked up by the electron detector and interpreted to produce an image. In addition to imaging, the S-4700 allows for elemental analysis of a sample's chemical composition using either energy dispersive spectroscopy (EDS) or wavelength dispersive spectroscopy (WDS). The S-4700 has an ultimate imaging resolution of 2nm at 20kV, making it useful for a wide variety of applications, from observing the smooth surface of semiconductor wafers to inspecting the within of nanowires. This microscope is also capable of observing non-conductive specimens, making it uniquely suitable for a variety of industrial applications. The S-4700 also offers low vacuum imaging capabilities, allowing the operator to view samples with no sample preparation. This is achieved by introducing a pump in the sample chamber, which creates a low pressure vacuum to eliminate the need for vacuum coating on the sample prior to imaging. Other features of the S-4700 include Autofocus, Motorized Stages, Image Management Suite and Data Analysis Software, enabling scientists and engineers to perform fast, precise and accurate analysis. Overall, S-4700 Type I SEM makes it easy to capture, analyze and interpret images of even the most minute features on any sample surface. It is a reliable and versatile imaging instrument suitable for multiple microscopy applications.
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