Used HITACHI S-4700 Type I #293812845 for sale
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ID: 293812845
Scanning Electron Microscope (SEM)
HP/Compaq Computer
Keyboard
Mouse
Toolbox and tools
Secondary electron image resolution:
2.1 nm at 1 kV
1.5 nm at 15 kV
Electron optics:
Cold field emission electron gun
Accelerating voltage: 0.5 – 30 kV (0.1 kV steps)
Probe current: 1 pA - 2 nA
Magnification: ×20 - × 500,000
Image display:
Operation/display OS: Windows NT
Frame resolution:
640 × 480 pixels
1280 × 960 pixels
2560 × 1920 pixels
Image formats: BMP, TIFF, JPEG
Scan speed:
TV/slow (0.5 – 40 s/frame) for viewing
Slow (40 – 320 s/frame) for recording
Image processing:
Automatic brightness & contrast
Autofocus, auto-stigmation
Raster rotation, averaging, frame integration
Color display
Auto data recording
Electrical image shift: ±15 µm (W.D. = 12 mm)
Vacuum system:
Pneumatic valve control
Vacuum levels:
Electron gun: ~10⁻⁷ Pa
Specimen chamber: ~10⁻⁴ Pa
Pumps:
Fore pumps: 140 L/min (168 L/min)
Diffusion pump: 570 L/s × 1 set
Ion pumps: ×3 sets
Dimensions:
Column: 82 × 88 × 165 (H) cm.
HITACHI S-4700 Type I is a scanning electron microscope ( SEM ) with a high-resolution secondary electron (SE) imaging equipment for observing the surface structure of various specimens. It is equipped with an ultra high vacuum ( UHV ) chamber, providing an environment of ultra-low contamination for specimen observation and analysis. S-4700 Type I provides users with the 6.7 nm SE resolution. It is capable of imaging a wide range of specimen with its super high magnifications magnification of 100 kx (~8 nm spatial resolution). Its advanced digital signal processing system allows for contrast boosting for better image clarity and selectable image processing functions to enhance the image contrast. The real time image refresh rate ensures that even the most delicate specimen details are accurately captured. The SEM-EDS auto-switch mechanism enables quick switching between functionality modes between the scanning electron microscope and energy-dispersive spectroscopy (EDS). HITACHI S-4700 Type I has an adjustable specimen chamber tilt angle, allowing for more precise and precise imaging. The specimen handling is made easier with the overhead footprint which is incredibly useful for specimens that require precise positioning. The specimen stage also features an auto focus unit. S-4700 Type I instrument is equipped with a large field of view photo-optic machine to enable direct high magnification imaging without compromising resolution. This allows for magnifications of up to 40,000x. HITACHI S-4700 Type I scanning electron microscope is the perfect instrument for both high resolution imaging and for analytical purposes. The high resolution images exhibit excellent contrast and resolution, perfect for detailed analysis, while the EDS capabilities offer an additional layer of analysis for users. Its various features in addition to its technical specifications make it a versatile tool for industrial and scientific applications alike.
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