Used HITACHI S-4700 Type I #293814603 for sale
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ID: 293814603
Wafer Size: 6"
Vintage: 2001
Field Emission Scanning Electron Microscope (FE-SEM), 6"
Energy Dispersive X-Ray Spectroscopy (EDS) detector
Cold Field Emission Gun (FEG) electron source
Secondary Electron (SE) detector
Backscattered Electron (BSE) detector
Anti-Vibration Table (AVT)
Vacuum pump
Control computer
Monitor
Chiller
Air compressor
2001 vintage.
HITACHI S-4700 Type I is a high-resolution scanning electron microscope (SEM) designed for imaging, analysis, and three-dimensional reconstruction of a wide range of samples. The SEM is equipped with a high-performance electron column and advanced digital image processor, allowing for imaging at magnifications up to 300,000x. To provide this outstanding resolution and image quality, S-4700 Type I utilizes an ultra-high vacuum (UHV) equipment with a special circuit to minimize particle contamination and maximize specimen stability. This system is composed of electron optics parts, detectors and a number of other components which extend the range of imaging possibilities. Additionally, the microscope also incorporates an electron source, condenser lens, specimen holder and sample chamber, enabling it to capture detailed images. Furthermore, HITACHI S-4700 Type I offers a wide range of analytical capabilities, such as electron energy loss spectroscopy (EELS) and energy dispersive x-ray analysis (EDS). These techniques allow for in-depth analysis of composition, structure, and composition of a wide variety of materials. S-4700 Type I can be equipped with a dedicated automation unit for unattended operation in research and development studies. This feature enables multiple samples to be sequentially analyzed with minimal human intervention. Additionally, the machine can also be equipped with a variety of stage attachments, including auto-stages, filter stages, auto-stages with filter stages, auto-stages with filter stages and auto-stages with filter cryo-stages, in order to accommodate a range of sample materials. Furthermore, the tool is also equipped with Pro Scanning Software which enables efficient, automated operation, as well as image analysis and image processing capabilities. Overall, HITACHI S-4700 Type I is an advanced scanning electron microscope offering unparalleled imaging, analytical and automation capabilities, making it an ideal choice for research, development studies and many other applications.
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