Used HITACHI S-4700 Type I #9230773 for sale

HITACHI S-4700 Type I
ID: 9230773
Scanning Electron Microscope (SEM) 5-Axis stage Does not include EDX.
HITACHI S-4700 Type I is an advanced scanning electron microscope (SEM), designed for high-resolution imaging and analysis of a wide range of materials. The equipment combines superior optics, automatic sample handling, and intuitive operation to provide superior performance and accurate results. S-4700 Type I consists of a main unit containing the electron optics, several electron lenses, and a vacuum-tight chamber. All components are precision-crafted to ensure optimum performance with minimal contamination. The microscope features an innovative magnetic optics system that significantly reduces aberrations caused by lens movement or temperature fluctuations. It also provides high-contrast images of samples such as semiconductors and nanostructures. The optics are mounted on a fine-focusing micrometer that allows precise alignment of the lenses. This feature allows for the generation of maximum resolution images, down to 1nm. A spectacular "flower-like" appearance of organic samples and a resolution of 0.1nm is achieved when using the special "scanning interference" mode. The main unit is capable of automatic high-level sample handling. This helps to reduce user-intervention and minimizes the risk of contamination. A variety of sample holders, including vacuum compatible plane holders, cooling stage, and a three-axis stage, are supported for optimum convenience. The intuitive user interface of HITACHI S-4700 Type I simplifies operation and offers access to a wide range of functions. The unit automatically records images in BMP, TIFF, JPEG and other formats. It is also capable of processing previously-scanned images for further analysis, as well as for archiving. All in all, S-4700 Type I stands out as a top-of-the-line scanning electron microscope. From its advanced optics to its automated sample handling, this machine provides reliable high-resolution imaging and extensive analysis capabilities.
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