Used HITACHI S-4700 Type I #9258486 for sale
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ID: 9258486
Wafer Size: 12"
Vintage: 2001
Scanning Electron Microscope (SEM), 12"
No EDX
2001 vintage.
HITACHI S-4700 Type I Scanning Electron Microscope (SEM) is a versatile, high-performance scanning electron microscope made by HITACHI High Technologies. The equipment is designed to provide advanced imaging capabilities to researchers in the field of surface science, material sciences, and analytical sciences. S-4700 Type I SEM combines state-of-the-art optics with a comprehensive particle source for imaging and analysis of a wide variety of samples. The integrated system provides high resolution imaging capabilities of up to 60nm with an acceleration voltage range of 0-30keV. Additionally, the unit is equipped with a range of advanced detectors such as an Everhart-Thornley detector, SE2, BSED, and digital image signal processor. The machine is also equipped with an X-ray Spectrometer, enabling the analysis of X-ray elements by energy dispersive X-ray spectroscopy (EDX). HITACHI S-4700 Type I is also suitable for cryo microscopy applications and is equipped with a cryo preparation chamber for precise sample preparation. The tool is also capable of secondary electron imaging and backscattered electron imaging, enabling users to perform advanced imaging techniques such as EDS tomography and phase mapping. To ensure optimal imaging conditions, the asset is equipped with an advanced stage control model and highly sensitive autopilot equipment. S-4700 Type I is designed for ultimate user comfort and convenience, with its easy-to-use operation and various automated functions. An intuitive touch-screen interface is included, allowing users to easily access all system functions. The unit also offers software programs to provide efficient and powerful operation of the sem, such as computer-assisted image processing and automated quantitative analysis. Overall, HITACHI S-4700 Type I SEM offers powerful imaging capabilities with a range of advanced detector and control systems, making it ideal for research in material science, surface analysis, and analytical sciences.
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