Used HITACHI S-4700 Type I #9265144 for sale

HITACHI S-4700 Type I
ID: 9265144
Field Emission Scanning Electron Microscope (FE-SEM).
HITACHI S-4700 Type I is a high performance scanning electron microscope (SEM). It has an ultra-high resolution of 0.4 nanometers and makes it ideal for imaging various specimens with very high accuracy. This advanced equipment also features an advanced field emission gun (FEG) which produces a beam of high energy electrons for sample surface analysis, with a final image size of up to 4,000 x 3,000 pixels. In terms of design, S-4700 Type I features a compact design layout that can fit into any laboratory workspace, and can also be used in a variety of geometries. This system also has a powerful electron control unit that allows for detailed, precise, and efficient control over the operation of the SEM column. The advanced imaging machine also contains two powerful lenses—an electron objective lens, and a parabola-shape collector lens—that work together to capture information that cannot be seen by regular optical microscopes. HITACHI S-4700 Type I also features a range of imaging functions, such as a large depth of field, high contrast imaging, extended depth of field, backscatter imaging, low magnification imaging, and variable pressure imaging by usage of the optional pressure unit. It is the only SEM tool on the market that offers a high resolution matrix imaging, which is ideal for displaying crystallographic structures. Additionally, the advanced image asset contains an array of features that can enhance the output image, such as contrast enhancement and three-dimensional imaging. In terms of safety, S-4700 Type I has advanced safety features that protect users from potentially harmful radiation, such as a passage protection and an electron shield unit that limits exposure to electron beams. It is also designed with a low voltage electron gun that reduces exposure risk even further. Overall, HITACHI S-4700 Type I Scanning Electron Microscope is an advanced model that provides researchers with unparalleled imaging capabilities. Its ultra-high resolution and extensive range of features makes it the ideal choice for imaging incredibly small specimens with intricate details.
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