Used HITACHI S-4700 Type I #9394048 for sale

HITACHI S-4700 Type I Scanning Electron Microscope (SEM) is a highly advanced tool designed to provide researchers with detailed images and measurements of the surface of microscopic samples. The instrument is equipped with a variety of functionality, including an electron source, electron optics, imaging detector, specimen preparation chamber, and a computer interface. The electron source in S-4700 Type I is capable of operating in three modes: In-lens, Extraction-Lens, and Schottky Field Emission. In-lens mode is used for accelerating electrons to the sample, while Extraction-Lens mode is used for accelerating electrons to high energies. Schottky Field Emission mode utilizes a heating element to increase electron emission and provide higher resolution. The electron optics of HITACHI S-4700 Type I comprises of a series of lenses and deflectors used to focus and control the properties of the electron beam. In conjunction with the electron gun, these lenses and deflectors are used to regulate beam current, size, and shape. Additionally, the lenses and deflectors can be configured for Magnified or Non-Magnified imaging, depending on the application. The imaging detector of S-4700 Type I is a digital charge-coupled device (CCD) camera used to capture images of the sample in both low and high vacuum modes. The detector is capable of producing both black-and-white and color images and offers resolutions up to 1.5nm per pixel. The specimen preparation chamber of HITACHI S-4700 Type I is designed to provide a sealed environment for the preparation and specimen analysis. This chamber is equipped with top and bottom tilting stages, as well as a specimen holder for mounting samples. The computer interface of S-4700 Type I allows for remote control and data exchange with the instrument. This interface is implemented via a dedicated proprietary software application, which provides users with powerful functionality to control, monitor, and customize operations. In summary, HITACHI S-4700 Type I is a highly advanced scanning electron microscope designed for applications in a wide variety of fields. The instrument is equipped with a variety of components and features, including an electron source, electron optics, imaging detector, specimen preparation chamber, and a computer interface, making it an ideal tool for researchers needing detailed images and measurements of microscopic samples.