Used HITACHI S-4700 Type I #9396172 for sale

HITACHI S-4700 Type I
ID: 9396172
Scanning Electron Microscope (SEM) With EDX Cables Monitor PC Keyboard Mouse Dongle key XRS-1130 EDX Housing EDX LN2 Tank with detector.
HITACHI S-4700 Type I Scanning Electron Microscope (SEM) is a leading-edge SEM that offers excellent imaging capabilities, particularly in the field of materials science. It provides unparalleled imaging with advanced imaging features, and its powerful analytical software allows users to perform detailed analysis of samples. This SEM comprises an electron gun, electron optics, and a sample stage. The electron gun is a focused point source of charged particles, capable of producing high-energy electron beams at high current densities. It includes a specimen chamber which houses the electron gun, electron optics, and sample stage. The electron optics contain several sets of lenses and deflectors, which shape and direct the electron beam. The sample stage is a high-vacuum platform that allows the user to precisely position and rotate the sample to be observed. S-4700 Type I utilizes a charged-coupled device (CCD) imaging device to convert an electron beam signal into a visible image. This imaging device captures images quickly and efficiently and produces clean, high-resolution images. In addition, this SEM features an optional Energy-Dispersive X-ray (EDX) attachment, which allows users to perform X-ray microanalysis on their samples. HITACHI S-4700 Type I is equipped with a high-performance, easy-to-use graphical user interface (GUI) for controlling all aspects of the microscope. The GUI includes crucial features such as image manipulation, image measurement tools, data collection, and analysis tasks. It also allows users to customize up to four operating parameters for each sample, such as magnification, gun wavelength, voltage and current, as well as adjustable parameters such as scan speed and scan rate. S-4700 Type I offers a range of practical applications, such as automatic SEM mapping, 3D analytical reconstruction, particle sizing and imaging of nanoparticles, and morphology analysis, all with excellent image resolution and accuracy. Its superior analytical capabilities make it an ideal tool for applications such as materials science, nanomaterials, and environmental monitoring. HITACHI S-4700 Type I is well-suited for both research and industrial laboratories, offering a reliable, affordable, and highly efficient SEM for all applications.
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