Used HITACHI S-4700 Type II #293587272 for sale

HITACHI S-4700 Type II is a scanning electron microscope (SEM) designed to provide high resolution imaging of specimens with a maximum magnification of up to 300,000 times. It features a new anti-vibration design to reduce vibration and improve image quality. HITACHI S 4700 TYPE II is a modular equipment that includes sample stages, an optical system, and progressive magnification. The optical unit includes an electron gun, column lenses, an objective lens, and an imaging machine. The sample stages are movable and can accommodate a wide range of sample sizes. The progressive magnification capabilities provide a high-resolution image of the detailed area with a maximum magnification of up to 300,000 times. The built-in image analysis functions allow for quick and easy data manipulation and analysis. S-4700 Type II also comes equipped with an area detector and a signal processing tool to enhance image quality. The area detector allows for a wider detection range of signal peaks and valleys, while the signal processing asset enables further signal processing, distortion corrections, and a variety of viewing angles. The detector's signal processing improves contrast and contrast resolution, allowing for more detailed view of sample features. This SEM allows users to capture bright and contrast images of the sample in combinations of various image processing functions such as contrast, brightness, and magnified views. In addition to high resolution imaging, S 4700 TYPE II is also equipped with a wide field of view imaging model. This equipment can increase the depth of focus of the specimen while still providing high-resolution imaging. The wide field of view allows for capturing fine details in the sample from a large area. It also has a variety of contrast modes such as contrast inversion and contrast stretching, which can be used to enhance image contrast and reveal finer detail. HITACHI S-4700 Type II also offers a variety of specimen preparation methods. The built-in sputter coater can uniformly coat specimen surfaces, allowing for multi-level substance analysis and enhanced image quality. The dual ionization source enables chemical species analysis and the back-scattered electron detector allows for detailed topography analysis of the sample. HITACHI S 4700 TYPE II is an invaluable tool for researching, analyzing, and documenting extremely small specimens. With its advanced design and capabilities, this SEM is ideal for any application requiring high resolution imaging and detailed specimen analysis.