Used HITACHI S-4700 Type II #293602528 for sale

HITACHI S-4700 Type II is a scanning electron microscope (SEM) that offers high resolution imaging . This particular product is geared toward users who are interested in imaging a variety of electronic materials, such as semiconductors, micro-devices, circuit boards, and more. This microscope allows researchers to observe more detail than ever before at a much higher resolution. It utilizes primary and secondary electron detection, allowing for precise images even at a very small scale. HITACHI S 4700 TYPE II is a desktop SEM that includes an air-cooled electron source, which helps maintain consistent imaging with little effort. The microscope has a maximum magnification of up to 2000x, which results in extremely fine details in the images. This microscope also has a variety of features designed to make the imaging process smoother, such as a low energy backscatter electron detector, a high resolution monochromator, and a robotic sample-holder equipment. S-4700 Type II is able to analyze various materials, regardless of the thickness or surface-topology of the specimen. This model is beneficial to researchers who need to analyze any material with a thickness of less than one micron. The microscope is equipped with a variety of sensors and features, such as a line-scanned electron gun, a 25 plane stage system, a chromium coating unit, a wide-angle backscatter electron detector, and a 5-axis manipulator. In addition to its imaging capabilities, S 4700 TYPE II is also able to analyze chemical composition and electrical characteristics. The built-in spectrometer can be used to acquire chemical composition information, and the secondary electron detection machine is able to acquire detailed imagery at a higher resolution than ever before. The microscope also includes the ability to analyze surface potentials, making HITACHI S-4700 Type II a powerful tool for those studying surface-related phenomena. Finally, HITACHI S 4700 TYPE II can be configured remotely and controlled from virtually anywhere, making it suitable for remote monitoring and control. This makes it an ideal choice for those who need to maintain control over their SEM, even if they are away from the laboratory. S-4700 Type II is an advanced instrument designed to meet the needs of those who need to study materials and objects on a small scale. Its features and capabilities make it a powerful tool for imaging materials and gaining useful information without sacrificing accuracy or quality.