Used HITACHI S-4700 Type II #293802476 for sale

HITACHI S-4700 is a powerful scanning electron microscope (SEM) ideal for a wide variety of demanding applications. With its advanced imaging capabilities, this SEM offers superior performance, automated operation, and unrivaled user experience. HITACHI S 4700 has an impressive maximum resolution of 1.5 nanometers and a detection limit of 0.5 nanometers. It is capable of capturing detailed images of specimens at magnification levels up to 200,000x. These magnified images allow for precise analysis of an immense range of objects, from micro size particles to large organic elements. Additionally, the microscope boasts a sample supply mechanism (SSM) for automatic specimen loading, which is designed to minimize sample contamination and maximize speed and efficiency. S-4700's advanced digital imaging system offers multiple detection modes, including secondary electron (SE), backscatter electron (BE) imaging, and X-ray analysis. It is also equipped with a unique low-vacuum mode, which enables imaging of surface objects while maintaining a minimal emissions level. Furthermore, the microscope can be customized to include electron backscatter diffraction (EBSD) capability, providing an additional tool for investigations of sample materials on an atomic level. The user experience of this SEM is managed by a user-friendly control software, PROTEM, which allows for easy manipulation of all the microscope settings, including magnification, brightness, contrast, and focus. This software also features an intuitive user interface and a comprehensive library of automated inspection scripts for quick study of large sample sets and similar specimens. With its excellent image quality and intuitive operation, S 4700 is an excellent choice for a wide variety of research applications. It is capable of completing complex microscopy tasks with extraordinary accuracy and speed, allowing users to explore the micro world in greater detail and reach new levels of research.