Used HITACHI S-4700 Type II #9234231 for sale

ID: 9234231
Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM) Resolution: 2.1 nm at 1 kV Image mode: Secondary electron image (2) Secondary electron detectors OXFORD EDS Included.
HITACHI S-4700 Type II is a scanning electron microscope (SEM) that provides superior imaging capabilities with a wide range of analytical functions. It is an excellent choice for scientific research, industry, and laboratory applications. The equipment features a 200kV tungsten filament gun with a large depth of field detector that allows for detailed analysis of a wide range of samples. The high resolution plus the ability to image thick samples make HITACHI S 4700 TYPE II ideal for imaging and analyzing a wide range of materials, including metals, ceramics, and organics. S-4700 Type II employs a state-of-the-art digital imaging system that is capable of storing a large number of images, along with features such as merging, filtering, video recording, and stitching images. It also incorporates an intelligent search capability for rapid retrieval of saved images. Along with a high resolution color monitor and user-friendly touchscreen interface, S 4700 TYPE II makes quality imaging straightforward and intuitive. The unit also includes several analytical technologies, including X-ray energy dispersive spectrometry (EDS) and secondary electron (SE) imaging, to provide comprehensive elemental and chemical information on a sample. The ability to perform live imaging and dynamic image optimization ensures optimum image quality. In addition to the standard imaging capabilities, HITACHI S-4700 Type II is equipped with a high throughput automated stage that can process multiple samples at once. The stage can move quickly between samples and automatically adjust the SEM current and magnification settings, yielding precise and clean images. A major benefit of HITACHI S 4700 TYPE II is its Portavis ion column, which provides superior ion beam deposition accuracy and quality compared to other SEMs. The machine is also compatible with an automated wafer chuck which is designed to ensure perfect flatness, improving accuracy and repeatability during analysis of semiconductors. Finally, a vacuum tool, He/Ar gas mixture, and cryogenic stage are all standard features included with S-4700 Type II, giving users multiple options for preparing their specimens. Overall, S 4700 TYPE II is an excellent choice for any application that requires superior imaging capabilities, automated sample processing, and reliable analytical functions. With its wide range of features and capabilities, HITACHI S-4700 Type II is capable of providing reliable and accurate results for a wide variety of materials.
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