Used HITACHI S-4700 Type II #9234280 for sale
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ID: 9234280
Scanning Electron Microscope (SEM)
Stage: Fully automatic
Operating system: Windows XP
BSE / SE Detector.
HITACHI S-4700 Type II scanning electron microscope (SEM) is a powerful and reliable analytical microscope system. It combines high resolving power and an excellent selection of micro imaging techniques. This versatile instrument was first released in 2007 and has become a staple of laboratories and research establishments all over the world. The S-4700 comes in two types; the Type I is suited for biological and medical applications, while the Type II is best used for physical and chemical analysis. It measures 409 cm wide, 160 cm high, and 98 cm deep and has a maximum scanning field area of up to 120 x 95 mm. Its scan resolution ranges from 2 to 50,000 nanometers, and the standard working distance is approximately 5.5 mm. HITACHI S 4700 TYPE II generates scanning electron images with three additional imaging techniques: secondary electron imaging, backscattered electron imaging, and scanning transmission electron microscopy. It also includes a patented variable pressure device to reduce surface charging effects. These capabilities allow users to accurately and efficiently study sample surfaces in order to understand their material composition and microstructural properties. The S-4700 offers high energy resolution, with a 0.6 eV resolution for X-ray detectors from 30 keV to 500 keV. With a large acceleration voltage range of up to 30Kv and its large sample chamber, it is possible to analyze samples of many dimensions and qualities. The advanced control console of the S-4700 is operated using an intuitive graphical user interface and can be used to plan, execute, and store imaging parameters. The built-in analysis system can be used to output images in a variety of formats and reproduce them in three-dimensional (3D) and stereo. S-4700 Type II is suitable for many applications requiring high image resolution or energy resolution, such as micro electronics failure analysis, defect examination, and in situ analysis. It is also an excellent choice for research centers, universities, and laboratories. With precise and reliable performance, S 4700 TYPE II is a reliable and professional tool for all types of imaging applications.
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