Used HITACHI S-4700 Type II #9299922 for sale

HITACHI S-4700 Type II scanning electron microscope (SEM) is a powerful research instrument used to analyze the microstructure of an object at very high magnifications. The microscope produces a large variety of images, from the surface topography to the inner-structure of the sample, allowing for an in-depth analysis of its composition and properties. The microscope also offers a wide range of secondary and analytical electronics. With the secondary electron detector, one can gain an understanding of the surface features at very high magnifications. The analyzer detector on the other hand, allows the user to detect the light and chemical elements in the sample. Furthermore, the energy dispersive spectrometry (EDS) setup perform X-ray analysis. The microscope is equipped with a high sensitivity and fine resolution secondary electron detector, which detects, and displays a range of information. The high-resolution digital camera allows the user to capture images quickly and efficiently. HITACHI S 4700 TYPE II SEM includes a fully motorized and high-vacuum capable TGT (Target Gas Injection) equipment. This feature creates a larger beam resulting in less beam divergence and a tighter electron beam focus. The optical system of the instrument is able to generate an imaging field of up to 27mm, supporting magnifications up to 1840x. Additionally, the microscope has been engineered to deliver a stable and accurate worksurface. To achieve this, gentle curves and small tapers are used on the sample stage. The XYZ scanner, laser interferometer stage, and motorized unit enable the user to accurately set up the measurements. The user-friendly control interface in the software allows users to access the SEM's parameters quickly and easily. Along with that, the scan cycles, scan data, and scan-zone settings, can all be altered instantly. This machine makes it simple to configure the imaging parameters and observe the results. The surface detector of S-4700 Type II SEM also provides data from all 3 dimensions, which can be used to accurately measure the topographical features. Moreover, the possibility of using visual or graphic masks in combination with the Position Adapter (PA) enables the user to perform area- or linear-specific analysis. Overall, S 4700 TYPE II SEM is an advanced research tool that offers a wide-range of imaging capabilities. With its fast visual feedback and efficient operation, the microscope is suitable for studies in fields such as biology, material science, and semiconductor technology.