Used HITACHI S-4700 Type II #9299929 for sale

HITACHI S-4700 Type II is a scanning electron microscope (SEM) designed for imaging and analysis of all types of materials. This SEM features a state-of-the-art in-lens secondary electron detector and a newly-designed electron column. The electron column produces high resolution images with low noise levels. The magnification range of HITACHI S 4700 TYPE II can reach up to 500,000x, making it suitable for a variety of applications. The model also features a large depth-of-field detector with a field emission cathode, ensuring high sample stability and the lowest possible noise. In addition, the system includes a laser-based sample positioning system that provides repeatable and reliable alignment of sample locations. S-4700 Type II is also equipped with an array of detectors and automated analysis tools, including energy dispersive X-ray spectroscopy (EDS) and cathodoluminescence (CL) spectroscopy, for extensive analysis of examined samples. Designed for manual sample positioning, S 4700 TYPE II features automated sample alignment and movement on x, y and z axes. Additionally, the model's large specimen chamber enables it to image and analyze samples up to 200mm across. A variety of optical accessories, such as a differential interference contrast (DIC) head, a stereo viewer and a polarization analyzer, are also available for enhanced sample observation. HITACHI S-4700 Type II is compatible with a variety of computers, allowing users to quickly and conveniently transfer images and data. This SEM is the perfect choice for advanced research as it is capable of imaging and analyzing samples down to the nanometer level.