Used HITACHI S-4700 Type II #9382370 for sale

HITACHI S-4700 Type II is a field emission scanning electron microscope (FE-SEM) used for imaging, analyzing, and measuring images of various samples. This type of microscope uses a focused beam of electrons as its source, allowing for extremely high magnification and resolution of up to 500k×. The highly specialized SEM operates in both low and high vacuum modes, and includes numerous features to take advantage of the increased magnification magnitudes available with this type of microscope. Its design consists of a cathode and column set assembly, a source of secondary electrons, a sample chamber, and an electromagnetic lens that acts as a focusing element. With a scanning range of up to 500 ㎛, HITACHI S 4700 TYPE II offers a wide range of possibilities for sample analysis and imaging. To facilitate high magnification imaging, the S-4700 Type IIfeatures a cold field emission electron source, on-axis analytical capabilities, and a wide range of fields of view. The on-axis analytical capabilities offer an extended range of information about the sample. Structural analyses such as elemental composition, surface topography, overlayers, crystallographic structure, and the internal composition of a material are possible due to the added resolution, signal strength, and sensitivity. The resolution and magnification on the S-4700 Type IIis most impressive. Both x-y and z axis are capable of controlling the positioning of the sample in relation to the electron beam to achieve the utmost precision of resolution. A low vacuum mode allows for up to 5K× magnification, while a high vacuum mode results in up to 500K× magnification. In addition to the high resolution, the S-4700 Type IIalso offers the capability of imaging in a variety of speeds. This range of speeds allows for an array of possible experiment times and sample life due to the limits on potential electronbeam damage. The analytics available on the S-4700 Type IIinclude automatic acquisition of STEM images, signal intensity control, backscattered electron imaging, and chemical analysis via energy dispersive spectroscopy (EDS). This combination of high-quality imaging, exceptional mobility, and comprehensive analytical capability are unmatched by any other SEM system. Utilizing the latest in FE-SEM technology, the S-4700 Type IIis designed for those in need of maximum resolution and effectiveness. The features and capabilities of the S-4700 Type IIprovide researchers, scientists, and engineers with reliable results and trustable images in both industry and laboratory. Its advanced and powerful technology makes the S-4700 Type IIthe perfect choice for those searching for the highest quality imaging.