Used HITACHI S-4700 #150536 for sale

Name: HITACHI S-4700
Brand: HITACHI
SKU: 150536
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Scanning Electron Microscopes

Manufacturer

HITACHI

Model

S-4700

ID: 150536

FE SEM 1.5 nm resolution at 15 kV, 12 mm WD 2.5 nm resolution at 1 kV, 2.5 mm WD Magnification ranges: 30x to 500,000x Specimen tilt at 12 mm WD up to 45° Brightness: ~ 2 X 109 A / cm2/sr Energy spread: 0.2 to 0.3 eV Sample capacity: 100mm diameter x 17mm thick H maximum Oil-free vacuum systems pump column and sample exchange Image modes: secondary and backscattered electron images (2) Secondary electron detectors: above and below objective lens Digital image formats: BMP, TIFF, JPEG at 640 X 480, 1280 X 960, or 1560 X 1920 pixels Includes: Non-cryo sample holders CryoSEM observation using EMITECH K-1250 cryo stage Backscatter imaging at TV rates and low voltage (threshold 2.5 kV on gold) with Autrata modified YAG (yttrium aluminum garnet, cerium doped) crystal KEITHLEY specimen current detector Applications: High-resolution topographic contrast (Se) and atomic number contrast (BSe) imaging of biological and non-biological samples in both room temperature and cryo modes Applicable to imaging of immunogold labeled individual cells and bacteria Specifications: Secondary electron image resolution 2.1 nm guaranteed (at 1 kV) 1.5 nm guaranteed (at 15 kV and W.D. 12 mm or X-ray analysis position) Backscattered electron image resolution (optional) 3.0 nm guaranteed (at 15 kV YAG detector, optional) Cold finger and specimen exchange chamber as standard. Allowing sample exchange via airlock without repositioning Optional integrated EDX system with 30 degree take-off angle Fully digital imaging, image processing and archiving system Dual SE detectors for versatile imaging (SE and BSE) ExB energy filter Beam shift: +/-15um.

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HITACHI S-4700 is a scanning electron microscope (SEM) that is part of the S series of SEMs produced by HITACHI Ltd. HITACHI S 4700 is a high-performance SEM that produces high-quality images and has a number of user-friendly features. S-4700 has a number of unique characteristics that make it an excellent choice for use in research and educational facilities. It has a large field of view (FOV), allowing it to capture images of large samples and areas. Its high resolution and contrast capabilities produce detailed and sharp images with minimal background noise. The image stack mode allows users to acquire multiple continuous slices with various viewing angles and magnifications. S 4700 is well-suited for a wide variety of sample types. Its high-speed and powerful magnification range (up to 1000x) make it suitable for observation of things such as metals and ceramics with nanometer-level resolution. Its large range of voltage settings (0.5kV-30kV) allows users to quickly adjust the microscope for observation of samples with a variety of shapes, sizes and materials. The small spot and column size options for the electron beam provide further flexibility for sample observation. HITACHI S-4700 is also equipped with a large number of user-friendly features. Its large LCD display and touchscreen interface provides easy access to all the functions and settings of the SEM. Its low-temperature mode, automatic drift correction system, and an autocentering camera make data acquisition process simple and hassle-free. In conclusion, HITACHI S 4700 is a high-performance SEM that produces high-quality images and has a number of user-friendly features. It is highly versatile, allowing users to explore a wide range of samples and materials. Its large field of view and powerful magnification range make it suitable for applications such as metals and ceramics observation with nanometer-level resolution.