Used HITACHI S-4700 Type II #293626406 for sale

HITACHI S-4700 Type II is a scanning electron microscope (SEM) that is widely used in the world of science and engineering. This SEM uses a semiconductor based electron gun to produce an electron beam that is capable of magnifying to a maximum limit of 350,000x. HITACHI S 4700 TYPE II also features a field-emission electron source for high-resolution imaging, allowing for exceptional levels of detail when analyzing a sample. S-4700 Type II SEM features an automated sample handling equipment for an enhanced user experience when scanning multiple samples. This system quickly and accurately indexes, moves, and locates samples that require higher resolution scanning. This is especially beneficial for large samples that may require high levels of resolution without needing to manually move the sample. S 4700 TYPE II also offers a high-sensitivity detector that is capable of detecting particles as small as 1nm in size. This is a remarkable level of sensitivity, allowing scientific and engineering professionals to better observe the physical and chemical properties of a wide variety of materials. This type of SEM is ideal for applications such as micro-fabrication, materials research, and failure analysis. HITACHI S-4700 Type II also offers a large number of advanced features, such as the ability to detect a variety of materials including metals, semiconductors, ceramics, and plastics. This is facilitated by the exclusive PELF (Racetrack and Double Expansion) lens unit, which enables the SEM to acquire high-resolution imaging of a broad range of materials. This machine is also able to accurately measure at high speeds, allowing for quick and efficient analysis of samples. HITACHI S 4700 TYPE II also has a vacuum tool that allows for extremely high purity imaging. This is important for applications such as micro-electronics where the environment needs to be kept highly sterilized to achieve accurate results. In addition, S-4700 Type II also has a dual-stage magnetic levitation asset for the sample positioning, which helps minimize the time and effort needed to move samples. The operational range of S 4700 TYPE II also includes a temperature range of -45°C to 500°C as well as a pressure range of 0.1 Torr to 10 Torr. This wide range allows the SEM to analyze a variety of samples under a variety of environmental conditions. Overall, HITACHI S-4700 Type II is an incredibly advanced SEM that has a wide range of features and capabilities. It is ideally suited for micro-fabrication projects, materials research, and failure analysis, as well as any other application that requires high-resolution imaging and accurate measurements. The integrated sample handling model, as well as its temperature and pressure ranges, make it a great choice for scientific and engineering applications.