Used HITACHI S-4700 #293632285 for sale
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ID: 293632285
Wafer Size: 6"
Vintage: 2000
Field Emission Scanning Electron Microscope (FE-SEM), 6"
Electron gun: Cold field emission type
Lens system: 3-Stage electromagnetic lens reduction method
Objective lens: Movable aperture
Correction coil: 8-Pole electromagnetic system
Scanning coil: 2-Stage
Type II Sample fine movement device
Secondary electron resolution:
1.5 nm Acceleration voltage: 15 kV, WD: 12 mm
2.1 nm Acceleration voltage: 1 kV, WD: 2.5 mm
Magnification:
LM Mode: 20-2,000x
HM Mode: 100-500,000x
5-Axis motor driving:
X: 0~100 mm
Y: 0~50 mm
Z: 2.5~30.0 mm
T: -5°~60°
R: 360°
Detector:
Secondary electron detector
Ultra-sensitive reflected electron detector
Energy dispersive X-ray detector
Scan mode:
Normal scan
Selected area scan
Line scan
Photo scan
Spot position
Average concentration distribution
Dual mug / split
Oblique
PC: Pentium 32 MHz or higher
RAM: 32 MB or more
HDD: 2.4 GB or more
Operating system: Microsoft Windows NT
Color monitor, 17"
CRT, 7"
Signal processing:
Real-time image display
Automatic image adjustment (Brightness, contrast)
Gamma control
Derivative image display (Contour enhancement)
Inverted image display
Autofocus (AFC)
Auto stigma
Memory: 2560 x 1920
Image integration
Contrast conversation
Color display
Beam blanking
Raster rotation / tilit competition
Scanning speed: TV, slow 0.5-40s/frame
Electrical field of view movement: ± 15 µm (when WD= 12 nm)
Frame capacity:
1280 x 960
640 x 480
2560 x 1920
Display size:
Standard: 640 x 480
(2) Screen displays:
512 x 480
Full 1024 x 700
Digital beam control
Pre-processing related:
YAG Type reflected electron detector
Energy dispersive X-ray analyzer
E-1030 Mild sputtering equipment
Multi-prep system
Ethernet network interface
Video amplifier unit
Photomal power supply unit
Acceleration voltage: 0.5–30 kV (0.1 kV step)
2000 vintage.
HITACHI S-4700 is a powerful scanning electron microscope (SEM) that is built to meet the highest standards in imaging. With its built-in signal processor, HITACHI S 4700 produces high-resolution images, even at low magnifications. The powerful and accurate scanning motors of S-4700 also ensure fast and accurate imaging. S 4700 is equipped with a three-stage column stage that offers a wide range of magnification capabilities. It also includes a double-stage condenser and objective lenses to ensure that the images are always sharp and clear. HITACHI S-4700's ultra-thin window assembly and the digital imaging system make it able to achieve the highest contrast and resolution for a variety of samples. HITACHI S 4700 features two separate detectors that are used for the detection of secondary electrons. In the imaging mode the secondary electrons are collected onto the detector, while in the energy dispersive X-ray (EDX) mode a parallel beam of X-rays is used to excite the sample. The information collected is then converted into images. S-4700 is capable of capturing various geometric shapes and levels of detail. In addition, the integrated live preview feature allows users to make adjustments and review images in real-time, reducing imaging time and improving overall accuracy. S 4700 has two internal low-vacuum pumps that allow for low-vacuum performance. This feature is beneficial when working with samples that require low pressures. The low-pressure operation also increases the safety of the users, since it eliminates the possibility of explosions. HITACHI S-4700 is a high-quality scanning electron microscope that is capable of making extremely detailed images. With its advanced imaging capabilities, HITACHI S 4700 is a perfect choice for a variety of applications, ranging from material analysis to semiconductor
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