Used HITACHI S-4700 #293648637 for sale

HITACHI S-4700 scanning electron microscope (SEM) is a versatile, compact, and user-friendly SEM designed to make precision imaging easier and faster. It's integrated with an array of advanced features that make operation, data acquisition, and analysis easier than ever. It's ideally suited for use in a wide range of applications like materials research, nanotechnology, industrial product quality control, engineering, and academic research. HITACHI S 4700 SEM features a single quadrant electron column with a 3-axis stage and a proprietary energy dispersive x-ray spectroscopy (EDS) system. This design allows for simultaneous imaging, automation, and analysis. It provides high-speed, high-resolution, large field imaging and navigation across a large 5K x 7K area. S-4700 SEM also features dual-mode EDX that enables users to quickly switch between an advanced, low-background spectroscopy mode for high-resolution elemental mapping and analysis, and a fast "spot analysis" mode for quick, confident analysis. S 4700's ergonomic design makes it easy to set up and operate. The built-in user-friendly interface makes it easier than ever to take advantage of its powerful features and advanced functions. The microscope can also be directly connected to a LAN or USB device, allowing users to connect to remote data storage or problem solving systems. HITACHI S-4700 SEM offers high-performance imaging and analysis and advanced automation capabilities. Its directional beam emitter enables high-speed imaging and an inherent stability of 3.2 nanometers and resolution of 1 nm on under optimal circumstances. The low-noise design ensures the imaging quality and enables a maximum imaging speed of 1000fps. Additionally, its large 5K x 7K area makes it ideal for resolving patterns in large-scale samples and for advanced applications that require a larger field of view. HITACHI S 4700 SEM makes the most of the advanced S-4700 digital imaging technology, featuring robust data acquisition, processing, imaging and automation. Users can easily control image acquisition, viewing, and processing. They can also use template imaging and digital operation functions for enhanced efficiency and rapid survey scans of large-scale samples. S 4700 SEM is an ideal choice for applications ranging from materials research and nanotechnology to industrial product quality control, engineering, and academic research. With its integrated features, it is an efficient and cost-effective tool for quick and accurate imaging, analysis, and automation.