Used HITACHI S-4700 #293648639 for sale
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ID: 293648639
Wafer Size: 4"-6"
Vintage: 1999
Scanning Electron Microscope (SEM), 4"-6"
1999 vintage.
HITACHI S-4700 is a scanning electron microscope (SEM) that is often used for high resolution imaging as well as for field emission and analytical tasks. This SEM is highly suitable for educational and research applications, as it is renowned for its quality, reliability, precision and repeatability. HITACHI S 4700 is equipped with a back-scattered electron signal detector, which has a signal collection efficiency of 98%, and makes detection of weak signal much more sensitive. This system is also able to detect a wide range of signal intensities, making it capable of capturing high quality images. S-4700 is designed to provide a high level of performance while requiring minimal maintenance. The system features a maximum accelerating voltage of 10 kV to 32 kV, allowing users to view even the most delicate structural details of non-conductive samples. The SEM is also equipped with a unique SDD (Secondary Electron Detector) for high performance imaging and detailed analysis. S 4700 also includes automated sample preparation capabilities, minimizing the involvement of the user in routine processes. This SEM is capable of performing automatic cleaning, alignment, tilting and re-alignment of samples, improving data accuracy and sensitivity. HITACHI S-4700 is also outfitted with a variety of additional features, such as a high resolution image sensor, navigation joystick and an advanced imaging software package for better control over the data and analysis process. HITACHI S 4700 includes a highly-versatile probe current controller that can be used to adjust the amount of probe current, allowing users to monitor the condition of their sample. S-4700 is an ideal choice for both research and teaching purposes. Its advanced performance and reliability are unmatched, while its features and design make it an excellent addition to any laboratory. This SEM provides unprecedented levels of accuracy, detail and insight into non-conductive materials.
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