Used HITACHI S-4700 #293651678 for sale

HITACHI S-4700 scanning electron microscope (SEM) is a unique device with powerful capabilities for imaging, analysis, and inspection on a minute scale. It utilizes electron beams to achieve exceptionally high resolution surface imaging. With a maximum acceleration voltage of 30 kV, HITACHI S 4700 employs multiple imaging modes, allowing use for semiconductor inspection and classification, failure analysis, particle analysis, and surface analysis. The specimen chamber is well designed for ease of use. With a base pressure of 2.0 x 10-4 Pa, measurements and collectibles can be obtained quickly with little efforts. The chamber also features movable filtering software that eliminatesmost of the scattered electrons generated from vibration detectors. Also, the chamber comes with an Ion Beam Path Configurator (IBPC) which allows users to easily adjust the beam trajectories to optimize the images with precision. S-4700 is capable of not only obtaining topographical information, but also in performing elemental analysis. Using an energy dispersive spectrometer (EDS), the SEM scans the surface of a sample and detects the emitted detectable X-rays with a solid-state detector. This method can analyze sample chemistry in a variety of materials, with very precise resolution. Although S 4700 comes with a wide range of accessorizes, the most comprehensive attachment is a charged particles column (CPC), which allows the specimens to be scanned in 3-dimensions, enabling the most accurate analysis of certain samples. HITACHI S-4700 is a powerful tool for material scientists and engineers that need high resolution imaging and analysis capabilities on a small scale. With the robust features of HITACHI S 4700, it is a great choice for obtaining detailed pictures as well as elemental analyses, this device works great for conducting dynamic analysis, failure analysis, defect detection and a wide range of other customization applications.