Used HITACHI S-4700 #293654994 for sale

HITACHI S-4700 is a powerful scanning electron microscope (SEM), developed by HITACHI High Technologies. This microscope involves a high resolution monochrome electron detector, which allows for highly intricate imaging of samples. The microscope includes an in-lens or cold-field emission electron source and offers variable accelerating voltages up to 30kV. HITACHI S 4700 has a magnification range of 20X to 350,000X and a resolution of 0.2 nanometers. The microscope has built-in functions allowing for automated scanning, imaging and analysis processes. It performs various types of analysises, including electron diffraction, X-ray spectral analysis and backscatter imaging. For any research requiring fine-scale mapping of samples, such as studies on transport of materials and chemical mapping, S-4700 is particularly suitable. It has an excellent imaging equipment for both high resolution and high contrast analysis. Its integrated imaging capabilities allow for analysis of both surface morphology and internal construction. Sample manipulation can be achieved in air or vacuum conditions to provide a cross-sectional imaging. The microscope also features a sample carousel, allowing for the analysis of many specimens with a turning angle of 45 degrees and automated positioning without manipulating the sample stage. This greatly reduces the time needed for specimen preparation. S 4700 has a built in ion beam system for sample processing, which provides a high level of control over electron-sample interactions. This unit has been designed to produce improved image quality and enhanced resolution. It also allows for faster sampling, which reduces sample preparation time. HITACHI S-4700 has a customizable user interface to provide easy access to powerful imaging, analysis and control capabilities. It can be connected to any computer machine and can be used with a variety of controllers. The user can choose either manual or computer-controlled operations and access powerful image-rendering and image-processing tools. HITACHI S 4700 is a high performance scanning electron microscope and is suitable for various types of research projects. It provides a powerful imaging tool allowing observation of fine detail and accurate analysis of sample composition. Its advanced features, including the ion beam asset, offer enhanced control and flexibility, making it an ideal instrument for those looking to obtain high resolution imaging of specimens.