Used HITACHI S-4700 #293662759 for sale

HITACHI S-4700 is a state-of-the-art scanning electron microscope (SEM). It is an integrated microanalysis equipment that is has the capability of high resolution imaging and high speed analytical performance. It has a wide range of application and is suitable for a variety of fields including microelectronics, microfabrication, failure analysis, failure analysis, materials characterization, life science, and nano-particle analysis. HITACHI S 4700 has an optical system that allows for high resolution imaging and imaging of a variety of substances including polymers and other inorganic materials. It features an advanced atom probe detector which allows for highly accurate and detailed analysis with its high sensitivity and sensitively adjustable electron beam. It is equipped with a powerful electron optics and an ultrahigh-vacuum (UHV) environment to provide stable, sharp, and effective images. S-4700 also features a low kV imaging unit that enables high resolution imaging of non-conductive samples. S 4700 utilizes a digital signal processing machine to allow for precise and automated operation. It features real-time remote control data collection which allows for analysis of multiple samples at the same time. Its highly effective and efficient noise suppression tool enables high signal-to-noise ratio imaging with minimal noise. In addition, its low electron dose mode offers low charging and radiation dose which is beneficial for scanning delicate and fragile materials. HITACHI S-4700 has several applications, including imaging and analysis of nanoparticles, nanofibers, and scanning of MEMS and microelectronic devices. It can also perform multiple voltage imaging, detection of fractures and corrosion, defect analysis of materials, and magnetic domain imaging. Its high resolution imaging capability allows the user to accurately study the properties of materials at a microscopic level. HITACHI S 4700 has an intuitive user interface with a range of powerful tools, such as a 2D function generator, to streamline data acquisition and analysis processes. It also includes a comprehensive suite of software to facilitate data management, archiving, and remote control. Furthermore, the instrument has a built-in scan chamber that decreases particle contamination and ensures contamination-free samples. S-4700 is a reliable and powerful microscope and is ideal for modern-day research and sample analysis.