Used HITACHI S-4700 #293753099 for sale

HITACHI S-4700 is an advanced scanning electron microscope (SEM) designed for both high-resolution imaging and elemental analysis of a range of different sample types. It is capable of high speed imaging at low beam energies and high-vacuum operation, making the microscope well suited for a wide range of industrial, research, and educational applications. HITACHI S 4700 is equipped with a cold field emission source, double stage vacuum system, high-stability secondary electron detector, and high-resolution back-scatter detector which allow for wide ranging magnifications and sample resolutions. This provides researchers with precise two-dimensional imaging at up to thousandth-of-an-nanometer resolutions. It is also capable of a wide range of elemental analysis methods, allowing for full chemical characterization of specimens. In addition to its imaging and analysis capabilities, S-4700 is equipped with numerous automated functions making it highly user friendly. This includes several automated sample preparation systems, automated vacuuming, automated alignment, and an automated calibration software. Many of these functions can be pre-programmed to allow for automated imaging of samples. The microscope is also highly adaptable and can be outfitted with several additional stages and detectors for specialized applications. This allows users to customize S 4700 for their research, including adding additional detectors for 3D imaging, EDS and WDS analysis, as well as, focused ion-beam (FIB) integration. Finally, HITACHI S-4700 is equipped with several safety features including automated interlock systems, shielding, electronic cooling and EDX spill shields. This makes the system user friendly and safe for a wide range of industrial and educational applications. In short, HITACHI S 4700 is a versatile and user friendly scanning electron microscope capable of high resolution imaging and elemental analysis at nanometer scales. It is designed for research, industrial, and educational applications, and is equipped with several automated functions, flexible stages and detectors, and multiple safety features.