Used HITACHI S-4700 #293758113 for sale

HITACHI S-4700 is a scanning electron microscope (SEM) designed for imaging and analysis of a wide range of samples at different magnifications. It features a high-definition imaging system and has a maximum resolution of 0.8nm in the secondary electron detector that provides high resolution images. HITACHI S 4700 is equipped with a high-tilt in-lens detector that provides a wide range of electron optics with a large field of view. The in-lens detector is ideal for imaging of approximately 1-2nm resolution and is capable of producing high contrast and sharp images. Additionally, the lens is equipped with a more powerful and controlled accelerating voltage that ensures high quality imaging. S-4700 has an environmental chamber with precise temperature control over a wide range. This allows samples to be analyzed in their native environment at precise temperatures. The built-in peltier cooling stage keeps samples in a liquid nitrogen-like condition that prevents evaporation and ensures precise sample control. S 4700 also includes several different signal detectors, including a photoelectron backscatter, a secondary electron signal, and a difference signal for analysis of various types of samples. The detector also features a detachable energy filter that is designed to improve both quantitative and qualitative results when analyzing samples. In addition, HITACHI S-4700 has the capabilities of acquiring 3D images, a feature that is essential for the analysis of complex or curved surface structures. The built-in stage control allows for tilting, shifting and rotating samples to allow for precise control of the angle of view. The tilt capabilities allow for specimens to be imaged from up to 70° below the surface. This SEM also has advanced software that offers powerful imaging and analysis options. Software features such as automated particle recognition, dual imaging, and image repair tools are available to be used in combination with the high-magnification capabilities. Overall, HITACHI S 4700 scanning electron microscope is a powerful tool for imaging and analyzing specimens. Its unique features such as its high-resolution imaging system, powerful accelerating voltage, and environmental chamber make it an ideal choice for accurate imaging and analysis of a wide range of samples.