Used HITACHI S-4700 #293775757 for sale
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HITACHI S-4700 scanning electron microscope (SEM) is an advanced imaging instrument capable of providing a high resolution view of the micro and nan environments. It is an ideal tool for imaging and studying various materials, such as metals, ceramics, semiconductors, polymers, and biological samples. HITACHI S 4700 SEM features a unique dual column optical system that enables both high resolution digital Imaging and automatic particle sizing analysis. It also includes an energy-dispersive X-ray spectrometer with a high-performance silicon drift detector (SDD) for elemental analysis. S-4700's advanced ultra-high resolution imaging capabilities produce images of high resolution and contrast, including "virtual cross-section" images of nano-scale and micro-scale materials. Its advanced geometric distortion correction module enables both high accuracy and high resolution imaging. S 4700 also offers intuitive un-obtrusive software and a fully automatic stage control. HITACHI S-4700's internal environment is maintained in ultra-high vacuum conditions, which ensures minimal mounting evidence and clearance of the surface of the specimen for higher quality imaging. The low sample interaction of the ultra-high vacuum also allows for quick sample exchange and fast imaging. In addition, HITACHI S 4700 features a unique high-performance objective lens that allows for imaging of larger areas with greater depth of field. The objective lens also changes color automatically as its field of view is altered to reduce unwanted reflections and improve contrast. S-4700 is a powerful tool for investigating materials in many different ways. It is a reliable instrument that is compact, efficient, and provides excellent resolution and imaging. S 4700 is ideal for imaging applications in the fields of materials science and engineering, biology, and nanotechnology, among others.
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