Used HITACHI S-4700 #293805119 for sale

ID: 293805119
Vintage: 2002
Scanning Electron Microscope (SEM) 2002 vintage.
HITACHI S-4700 Scanning Electron Microscope (SEM) is a large-scale, high-impact microscopy equipment that is used by research labs to image a wide range of samples with a resolution exceeding 0.2 nanometers. This system combines a high voltage electron source, a large imaging chamber, a high resolution digital camera, and innovative imaging software to enable researchers to visualize even the smallest details of their samples. HITACHI S 4700 SEM employs a thermionic emission cold field electron source to provide a high-energy electron beam with a wide range of landing angles. This allows researchers to focus on features that are deep within the sample. The imaging chamber provides a high vacuum environment for the specimen, isolating it from ambient air particles. It is also equipped with a Faraday cup to measure the electron current density and a wide array of automated alignment functions to ensure image stability. S-4700 SEM is capable of generating images at high magnification levels with magnification ratios up to 1000x. Magnification is controlled by the voltage of the electron gun and adjustable lens apertures. At higher magnifications, it can generate overlaid images to distinguish different layers of the sample. Furthermore, the specimen chamber is equipped with a shutter to actively block the electron beam and reduce sample damage. To acquire images, S 4700 utilizes a 1024x1024 pixel digital camera, which can capture images in both bright-field and dark-field modes. These images are then transferred to the user's computer, where they can be analyzed with various sophisticated image analysis software packages. Additionally, HITACHI S-4700 SEM can also be used to study the chemical composition of specimens using a variety of detection techniques, such as EDX elemental analysis, STEM mapping and X-ray microanalysis. Furthermore, the unit provides options for measuring samples in a variety of contrast modes, including regular and high contrast secondary electrons, and backscatter electrons (BSE). In conclusion, HITACHI S 4700 Scanning Electron Microscope is a powerful, versatile and reliable imaging tool designed to meet the needs of research labs. By combining a high-energy electron source, a high-vacuum imaging chamber, and a versatile detection machine, this tool provides researchers with the ability to visualize and analyze samples with unmatched detail and accuracy.
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