Used HITACHI S-4700 #293808759 for sale

HITACHI S-4700
ID: 293808759
Field Emission Scanning Electron Microscope (FE-SEM) EDAX X-Ray Centaurus detector XFlash detector IBSS GROUP CV10X-DS Asher Manuals PC Accessories.
HITACHI S-4700 is a scanning electron microscope (SEM) designed for a range of applications in research and educational settings. It features cutting-edge imaging and analysis capabilities, while also offering a platform for developing new applications. HITACHI S 4700 has an in-lens secondary electron detector, with a vertical gap between the detector and the sample chamber, allowing the user to control the distance between the two. This further improves both imaging and analysis accuracy, along with the sample's protection from external factors. With its in-built energy filter, the instrument is able to accurately determine the elements of a sample. It also has a backscattered electron detector with a signal-to-noise ratio of 30,000:1, which provides fast and accurate acquisition of images. S-4700 has a highly sensitive cryogenic stage and a high-coverage cold-cathode detector. These features allow for perpendicular x-ray measurements, accurate elemental analysis and a field of view of up to 1.5 mm. The microscope can also work at a range of operating temperatures down to -196°C, and provides simultaneous imaging of large samples. This allows for the recording of fast, spatially resolved images over a wide temperature range. To further increase the accuracy and resolution of measurements, S 4700 has a built-in computer system that can store and process images. Using a variety of filters, the system can then process the images to further improve their accuracy. The instrument also comes with a software suite that includes tools such as image stitching and 3D reconstructions. With image stitching, researchers can merge multiple images into one panoramic view, while 3D reconstructions allows for the creation of three-dimensional models of the sample. In addition, HITACHI S-4700 comes with a wide range of accessories, such as specimen holders and stages, sample cells, electron sources, and electrical feedback control systems. With these features, users can optimize their experiments for the best possible outcomes. HITACHI S 4700 is a highly advanced scanning electron microscope that provides unparalleled performance, accuracy, and flexibility. It is the perfect tool for demanding users, offering unsurpassed imaging capabilities with maximum convenience.
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