Used HITACHI S-4700 #293811858 for sale

ID: 293811858
Wafer Size: 6"
Field Emission Scanning Electron Microscope (FE-SEM), 6" EDAX X-Ray Centaurus detector GV10x-DS Asher XFlash detector.
HITACHI S-4700 is a scanning electron microscope (SEM) used in the fields of materials science, biology and engineering. HITACHI S 4700 features a high-performance electron optical equipment capable of obtaining detailed images of specimens at high magnifications. It has an acceleration voltage of 0.1 to 30 kV, a magnification up to one million times, and a resolution of 1 nanometer. It is equipped with an auto-focusing system and a CCD camera which produces high resolution images in various modes, including secondary electron and backscattered electron imaging. In terms of the specimen stage, S-4700 is designed with an X-Y-Z-tilt sample stage for continuous observation and imaging. It has an airlock-equipped sample loading unit, while its live viewing monitor can trace the images of the sample in real time. The specimen stage is capable of moving in 3-axes with precision motions up to 0.1 nanometers. The temperature of the stage can be controlled and kept at temperatures as low as -150°C, so that even specimens such as biological samples can be observed without risk of thermal damage. In terms of its electron source, S 4700 is equipped with a cold field emission gun with a tungsten filament. This enables HITACHI S-4700 to produce high brightness electron beam and allows it to image fine structures of a specimen without damaging it. The cell mechanisms are also built into the gun, making high resolution imaging possible. To control the operation of HITACHI S 4700, a software called SU-4700 is provided. This software allows the user to set a variety of conditions, including parameters for the electron microscope, the sample stage and other elements such as cameras and detectors used on S-4700. So, in conclusion, S 4700 is an advanced scanning electron microscope with a high-performance electron optical machine. It includes a variety of precise control mechanisms and temperature control modules, allowing it to be used to examine a wide range of samples. It is widely used in engineering, materials science, and biology.
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