Used HITACHI S-4700 #293813489 for sale

HITACHI S-4700
ID: 293813489
Scanning Electron Microscope (SEM).
HITACHI S-4700 Scanning Electron Microscope (SEM) is a floor-standing instrument designed for high resolution imaging. It features a new generation STEM in-lens design with pole piece and wehnelt capillary lenses, a high resolution volt and current display, an auto-focus equipment that permits focus-ability over a 180mm working distance range, and an advanced imaging workflow with a high precision stage. HITACHI S 4700's detector is composed of a backscattered machine vision system that has a resolution of 30nm and a five megapixel optical zoom and includes a high-quality color camera for recording the user's imaging tasks. The Automated Beam Acquisition and Tracking (ABAT) unit allows the user to automatically focus and track the beam on target material and when combined with the Beam Auto Centering (BAC) machine and Fast Data Transfer, it provides high-resolution imaging with speed and accuracy. The main lens of S-4700 is composed of a 12.5-inch inner and outer lens combination. The inner lens, or wehnelt, is a high-resolution pole piece lens that improves detection sensitivity, determining the point spread and providing high-resolution imaging. The outer lens creates a highly uniform electrostatic field to help ensure stable illumination at low voltages. The overall result is a lens tool that is precise, fast, and provides high-resolution imaging of fine details. S 4700 is also equipped with a multi-mode scanning asset giving the user precise and rapid control over the beam window size, scan speed, and image brightness. This is especially useful when imaging very small targets like nanofibers and other types of nanoparticles. With the multi-mode scanning model, the user can adjust the beam width and intensity to achieve unprecedented detail at the micro and nano levels. Lastly, HITACHI S-4700 is widely used in high-end research and has the capability of producing amazing images of the sub-micron world. Interfaces such as the Digital Interface Equipment (DIS) and advanced point resolution systems allow users to collect data quickly and accurately. Coupled with the automated beam tracking and auto centering functions, HITACHI S 4700 delivers unparalleled imaging performance for a wide range of applications.
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